super bright round type led lamps doc. no : qw0905-LURF3333S rev. : a date : 24 - dec - 2004 data sheet ligitek electronics co.,ltd. property of ligitek only LURF3333S
note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation package dimensions part no. LURF3333S ligitek electronics co.,ltd. property of ligitek only page 1/4 1.5max 2.54typ ?? 0.5 typ 7.6 8.6 1.0min 25.0min 5.9 5.0 -60 x 100% 100% 50% 75% 25% 25% 0 50% 75% -30 x 0 x 30 x 60 x
note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. typical electrical & optical characteristics (ta=25 j ) algainp material LURF3333S part no red water clear color emitted lens spectral halfwidth ??f nm forward voltage @20ma(v) viewing angle 2 c 1/2 (deg) luminous intensity @20ma(mcd) dominant wave length f dnm 2.6 1.7 20 625 max. 11500 20 9500 typ. min. absolute maximum ratings at ta=25 j page 2/4 ligitek electronics co.,ltd. property of ligitek only part no. LURF3333S min. tsol soldering temperature operating temperature storage temperature tstg t opr electrostatic discharge reverse current @5v power dissipation ir esd pd parameter peak forward current duty 1/10@10khz forward current i f i fp symbol max 260 j for 5 sec max (2mm from body) -40 ~ +100 -40 ~ +85 j j 10 2000 120 g a v mw unit urf(s) 50 90 ma ma ratings
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 luminous intensity vs. temperature ambient temperature( j ) luminous intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) luminous intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 0 0 50 100 150 050100150 0.0 1.0 2.0 3.0 -40 -20 0 20 40 60 0.5 1.0 1.5 2.0 80 100 0.94 -20 -40 40 20 080100 60 0.8 0.0 0.2 0.4 0.6 1.0 1.2 urfs chip page 3/4 fig.2 luminous intensity vs. forward current 5.0 4.0 6.0 2.5 3.0 0.96 0.98 1.00 1.02 1.04 1.06 0 550 600 650 700 0.5 1.0 part no. LURF3333S
solder resistance test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 solderability test this test intended to see soldering well performed or not. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 ligitek electronics co.,ltd. property of ligitek only the purpose of this test is the resistance of the device under tropical for hous. thermal shock test high temperature high humidity test high temperature storage test low temperature storage test operating life test the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. reliability test: test item test condition description mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 page 4/4 reference standard part no. LURF3333S
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